Kirkland, E.J. (2010) Advanced Computing in Electron Microscopy [cd]. 2 nd ed. 2010. New York, NY: Springer US. doi:10.1007/978-1-4419-6533-2.
Chicago Manual of Style 17th edition (full note)Kirkland, Earl J. Advanced Computing in Electron Microscopy. Cd. 2 nd ed. 2010. New York, NY: Springer US, [2010?], New York, NY: Springer US, [2010?]. https://doi.org/10.1007/978-1-4419-6533-2.
American Psychological Association 7th editionKirkland, E. J. (ca. 2010). Advanced Computing in Electron Microscopy (2 nd ed. 2010) [Cd]. Springer US. https://doi.org/10.1007/978-1-4419-6533-2
Modern Language Association 9th editionKirkland, E. J. Advanced Computing in Electron Microscopy. 2 nd ed. 2010, cd, Springer US, 2010, https://doi.org/10.1007/978-1-4419-6533-2.
ISO-690 (author-date, Deutsch)KIRKLAND, Earl J, 2010. Advanced Computing in Electron Microscopy. 2 nd ed. 2010. New York, NY: Springer US. ISBN 9781441965332