Jain, P., Kumar, A., Van Winkelhoff, N., Gayraud, D., Gupta, S., El Amraoui, A., Palma, G., Gourio, A., Vachez, L., Palau, L., Buy, J.-C. und Dray, C. (2020) „High Density STT-MRAM compiler design, validation and characterization methodology in 28 nm FDSOI technology“, in. doi:10.23919/DATE48585.2020.9116202.
Chicago Manual of Style 17th edition (full note)Jain, Piyush, Akshay Kumar, Nicolaas Van Winkelhoff, Didier Gayraud, Surya Gupta, Abdelali El Amraoui, Giorgio Palma, Alexandra Gourio, Laurent Vachez, Luc Palau, Jean-Christophe Buy, und Cyrille Dray. „High Density STT-MRAM Compiler Design, Validation and Characterization Methodology in 28 nm FDSOI Technology“. In . https://doi.org/10.23919/DATE48585.2020.9116202.
American Psychological Association 7th editionJain, P., Kumar, A., Van Winkelhoff, N., Gayraud, D., Gupta, S., El Amraoui, A., Palma, G., Gourio, A., Vachez, L., Palau, L., Buy, J.-C., & Dray, C. (2020, März 1). High Density STT-MRAM compiler design, validation and characterization methodology in 28 nm FDSOI technology. https://doi.org/10.23919/DATE48585.2020.9116202
Modern Language Association 9th editionJain, P., A. Kumar, N. Van Winkelhoff, D. Gayraud, S. Gupta, A. El Amraoui, G. Palma, A. Gourio, L. Vachez, L. Palau, J.-C. Buy, und C. Dray. High Density STT-MRAM Compiler Design, Validation and Characterization Methodology in 28 nm FDSOI Technology. 2020, https://doi.org/10.23919/DATE48585.2020.9116202.
ISO-690 (author-date, Deutsch)JAIN, Piyush, Akshay KUMAR, Nicolaas VAN WINKELHOFF, Didier GAYRAUD, Surya GUPTA, Abdelali EL AMRAOUI, Giorgio PALMA, Alexandra GOURIO, Laurent VACHEZ, Luc PALAU, Jean-Christophe BUY und Cyrille DRAY, 2020. High Density STT-MRAM compiler design, validation and characterization methodology in 28 nm FDSOI technology. In: . 1 März 2020