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Treffer: High Density STT-MRAM compiler design, validation and characterization methodology in 28nm FDSOI technology

Title:
High Density STT-MRAM compiler design, validation and characterization methodology in 28nm FDSOI technology
Authors:
Jain, Piyush, Kumar, Akshay, Van Winkelhoff, Nicolaas, Gayraud, Didier, Gupta, Surya, El Amraoui, Abdelali, Palma, Giorgio, Gourio, Alexandra, Vachez, Laurent, Palau, Luc, Buy, Jean-Christophe, Dray, Cyrille
Source:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :1327-1330 Mar, 2020
Relation:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Database:
IEEE Xplore Digital Library