Nyeow, C., Ming, E.S.L., Razak, M.A.A., Kadir, N.A.A., Zakaria, N.A. and Safri, N.M. (2025) “Wafer Defect Pattern Classification with Res Net-50 Transfer Learning”, in. doi:10.1109/ECE67147.2025.11276696.
Chicago Manual of Style 17th edition (full note)Nyeow, Cheechea, Eileen Su Lee Ming, Mohd Azhar Abdul Razak, Nurul Ashikin Abdul Kadir, Nor Aini Zakaria, and Norlaili Mat Safri. “Wafer Defect Pattern Classification With Res Net-50 Transfer Learning”. In . https://doi.org/10.1109/ECE67147.2025.11276696.
American Psychological Association 7th editionNyeow, C., Ming, E. S. L., Razak, M. A. A., Kadir, N. A. A., Zakaria, N. A., & Safri, N. M. (2025, August 21). Wafer Defect Pattern Classification with Res Net-50 Transfer Learning. https://doi.org/10.1109/ECE67147.2025.11276696
Modern Language Association 9th editionNyeow, C., E. S. L. Ming, M. A. A. Razak, N. A. A. Kadir, N. A. Zakaria, and N. M. Safri. Wafer Defect Pattern Classification With Res Net-50 Transfer Learning. 2025, https://doi.org/10.1109/ECE67147.2025.11276696.
ISO-690 (author-date, Deutsch)NYEOW, Cheechea, Eileen Su Lee MING, Mohd Azhar Abdul RAZAK, Nurul Ashikin Abdul KADIR, Nor Aini ZAKARIA and Norlaili Mat SAFRI, 2025. Wafer Defect Pattern Classification with Res Net-50 Transfer Learning. In: . 21 August 2025