Treffer: Wafer Defect Pattern Classification with ResNet-50 Transfer Learning

Title:
Wafer Defect Pattern Classification with ResNet-50 Transfer Learning
Authors:
Nyeow, Cheechea, Ming, Eileen Su Lee, Razak, Mohd Azhar Abdul, Kadir, Nurul Ashikin Abdul, Zakaria, Nor Aini, Safri, Norlaili Mat
Source:
2025 2nd International Conference on Electronic and Computer Engineering (ECE) Electronic and Computer Engineering (ECE), 2025 2nd International Conference on. :55-59 Aug, 2025
Relation:
2025 2nd International Conference on Electronic and Computer Engineering (ECE)
Database:
IEEE Xplore Digital Library