Cite Them Right 11th edition - Harvard

Debeer, D., van Rijn, P.W. und Ali, U.S. (2020) „Multidimensional Test Assembly Using Mixed-Integer Linear Programming: An Application of Kullback–Leibler Information.“, Applied Psychological Measurement, 44(1), S. 17-32. doi:10.1177/0146621619827586.

Chicago Manual of Style 17th edition (full note)

Debeer, Dries, Peter W. van Rijn, und Usama S. Ali. „Multidimensional Test Assembly Using Mixed-Integer Linear Programming: An Application of Kullback–Leibler Information.“. Applied Psychological Measurement 44, Nr. 1 (1. Januar 2020): 17-32. https://doi.org/10.1177/0146621619827586.

American Psychological Association 7th edition

Debeer, D., van Rijn, P. W., & Ali, U. S. (2020). Multidimensional Test Assembly Using Mixed-Integer Linear Programming: An Application of Kullback–Leibler Information. Applied Psychological Measurement, 44(1), 17-32. https://doi.org/10.1177/0146621619827586

Modern Language Association 9th edition

Debeer, D., P. W. van Rijn, und U. S. Ali. „Multidimensional Test Assembly Using Mixed-Integer Linear Programming: An Application of Kullback–Leibler Information.“. Applied Psychological Measurement, Bd. 44, Nr. 1, Januar 2020, S. 17-32, https://doi.org/10.1177/0146621619827586.

ISO-690 (author-date, Deutsch)

DEBEER, Dries, Peter W. VAN RIJN und Usama S. ALI, 2020. Multidimensional Test Assembly Using Mixed-Integer Linear Programming: An Application of Kullback–Leibler Information. Applied Psychological Measurement. 1 Januar 2020. Bd. 44, Nr. 1, S. 17-32. DOI 10.1177/0146621619827586

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.