Cite Them Right 11th edition - Harvard

Beyerer, J., Nagel, M. und Richter, M. (2017) Pattern Recognition : Introduction, Features, Classifiers and Principles [cd], De Gruyter Textbook. München: De Gruyter Oldenbourg. doi:10.1515/9783110537949.

Chicago Manual of Style 17th edition (full note)

Beyerer, Jürgen, Matthias Nagel, und Matthias Richter. Pattern Recognition : Introduction, Features, Classifiers and Principles. Cd. De Gruyter Textbook. München: De Gruyter Oldenbourg, [2017?], München: De Gruyter Oldenbourg, [2017?]. https://doi.org/10.1515/9783110537949.

American Psychological Association 7th edition

Beyerer, J., Nagel, M., & Richter, M. (ca. 2017). Pattern Recognition : Introduction, Features, Classifiers and Principles [Cd]. In De Gruyter Textbook. De Gruyter Oldenbourg. https://doi.org/10.1515/9783110537949

Modern Language Association 9th edition

Beyerer, J., M. Nagel, und M. Richter. „Pattern Recognition : Introduction, Features, Classifiers and Principles“. De Gruyter Textbook, cd, De Gruyter Oldenbourg, 2017, https://doi.org/10.1515/9783110537949.

ISO-690 (author-date, Deutsch)

BEYERER, Jürgen, Matthias NAGEL und Matthias RICHTER, 2017. Pattern Recognition : Introduction, Features, Classifiers and Principles. München: De Gruyter Oldenbourg. ISBN 9783110537949

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.