Hancock, E.R., Wilson, R.C., Windeatt, T., Ulusoy, I. und Escolano, F. (Hrsg.) (2010) „Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings“, Image Processing, Computer Vision, Pattern Recognition, and Graphics. 1 st ed. 2010. Berlin, Heidelberg: Springer Berlin Heidelberg. doi:10.1007/978-3-642-14980-1.

Hancock, Edwin R, Richard C Wilson, Terry Windeatt, Ilkay Ulusoy, und Francisco Escolano, Hrsg. „Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings“. Cd. Image Processing, Computer Vision, Pattern Recognition, and Graphics. Berlin, Heidelberg: Springer Berlin Heidelberg, [2010?], Berlin, Heidelberg: Springer Berlin Heidelberg, [2010?]. https://doi.org/10.1007/978-3-642-14980-1.

Hancock, E. R., Wilson, R. C., Windeatt, T., Ulusoy, I., … Escolano, F. (Hrsg.). (ca. 2010). Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings [Cd]. In Image Processing, Computer Vision, Pattern Recognition, and Graphics (1 st ed. 2010). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-14980-1

Hancock, E. R., R. C. Wilson, T. Windeatt, I. Ulusoy, und F. Escolano, Herausgeber. „Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings“. Image Processing, Computer Vision, Pattern Recognition, and Graphics, 1 st ed. 2010, cd, Springer Berlin Heidelberg, 2010, https://doi.org/10.1007/978-3-642-14980-1.

HANCOCK, Edwin R, Richard C WILSON, Terry WINDEATT, Ilkay ULUSOY und Francisco ESCOLANO (Hrsg.). [cd]. 2010. 1 st ed. 2010. Berlin, Heidelberg: Springer Berlin Heidelberg. ISBN 9783642149801