Result: An Empirical Study of IR-based Bug Localization for Deep Learning-based Software

Title:
An Empirical Study of IR-based Bug Localization for Deep Learning-based Software
Authors:
Kim, Misoo, Kim, Youngkyoung, Lee, Eunseok
Source:
2022 IEEE Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2022 IEEE Conference on. :128-139 Apr, 2022
Relation:
2022 IEEE Conference on Software Testing, Verification and Validation (ICST)
Database:
IEEE Xplore Digital Library