Treffer: Research on automatic generation of test data for multi-path coverage

Title:
Research on automatic generation of test data for multi-path coverage
Authors:
Zhang, Meng, Li, Honghui
Source:
2021 4th International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE) AEMCSE Advanced Electronic Materials, Computers and Software Engineering (AEMCSE), 2021 4th International Conference on. :1185-1188 Mar, 2021
Relation:
2021 4th International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE)
Database:
IEEE Xplore Digital Library