Treffer: Analytics in the Field of Patent Documents
Title:
Analytics in the Field of Patent Documents
Authors:
Source:
2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus) Electrical and Electronic Engineering (ElConRus), 2021 IEEE Conference of Russian Young Researchers in. :364-368 Jan, 2021
Relation:
2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)
Database:
IEEE Xplore Digital Library