Result: Constraint-Based Test Input Generation for Java Bytecode
Title:
Constraint-Based Test Input Generation for Java Bytecode
Authors:
Source:
2010 IEEE 21st International Symposium on Software Reliability Engineering Software Reliability Engineering (ISSRE), 2010 IEEE 21st International Symposium on. :131-140 Nov, 2010
Relation:
2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE)
Database:
IEEE Xplore Digital Library