Treffer: An efficient method for generating exhaustive test sets

Title:
An efficient method for generating exhaustive test sets
Authors:
Stanion, R.T., Bhattacharya, D., Sechen, C.
Source:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 14(12):1516-1525 Dec, 1995
Database:
IEEE Xplore Digital Library