Treffer: Development of General and Data-Driven Machine Learning System for Quality Prediction on Manufacturing Lines
Title:
Development of General and Data-Driven Machine Learning System for Quality Prediction on Manufacturing Lines
Authors:
Source:
2025 IEEE International Conference on Computation, Big-Data and Engineering (ICCBE) Computation, Big-Data and Engineering (ICCBE), 2025 IEEE International Conference on. :424-429 Jun, 2025
Relation:
2025 IEEE International Conference on Computation, Big-Data and Engineering (ICCBE)
Database:
IEEE Xplore Digital Library