• Data Science Framework for Eva...

Treffer: Data Science Framework for Evaluation of Entrance Exams and Identification of Academic Patterns

Title:
Data Science Framework for Evaluation of Entrance Exams and Identification of Academic Patterns
Authors:
Huertas-Condori, Luciana N., Cabana-Yupanqui, Silvana B., Chaparro-Cruz, Israel N., Chaparro-Guerra, Americo
Source:
2025 IEEE XXXII International Conference on Electronics, Electrical Engineering and Computing (INTERCON) Electronics, Electrical Engineering and Computing (INTERCON), 2025 IEEE XXXII International Conference on. :1-8 Aug, 2025
Relation:
2025 IEEE XXXII International Conference on Electronics, Electrical Engineering and Computing (INTERCON)
Database:
IEEE Xplore Digital Library