Treffer: Functional Test Generation for In-Field Testing of Deep Learning Models with Test Storage Constraints
Title:
Functional Test Generation for In-Field Testing of Deep Learning Models with Test Storage Constraints
Authors:
Source:
2025 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2025 IEEE International. :223-232 Sep, 2025
Relation:
2025 IEEE International Test Conference (ITC)
Database:
IEEE Xplore Digital Library