Treffer: Low-Cost Functional Testing Based on Data Imputation Integrating Fault Tree Analysis and XGBoost

Title:
Low-Cost Functional Testing Based on Data Imputation Integrating Fault Tree Analysis and XGBoost
Authors:
Xu, Y., Wang, K., Zhao, Y., Kang, Y., Bai, P.
Source:
IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 15(8):1764-1777 Aug, 2025
Database:
IEEE Xplore Digital Library