Treffer: Static Analysis and LLM for Comprehensive Java Unit Test Generation

Title:
Static Analysis and LLM for Comprehensive Java Unit Test Generation
Authors:
Wei, Wei
Source:
2025 8th International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE) Advanced Electronic Materials, Computers and Software Engineering (AEMCSE), 2025 8th International Conference on. :87-92 May, 2025
Relation:
2025 8th International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE)
Database:
IEEE Xplore Digital Library