Treffer: Design of Function Test System for System on Chip Based on Automatic Test Equipment

Title:
Design of Function Test System for System on Chip Based on Automatic Test Equipment
Authors:
Fan, Yaohua, Wen, Hao, Tong, Jie, Su, Jiang
Source:
2024 5th International Conference on Electronic Communication and Artificial Intelligence (ICECAI) Electronic Communication and Artificial Intelligence (ICECAI), 2024 5th International Conference on. :562-567 May, 2024
Relation:
2024 5th International Conference on Electronic Communication and Artificial Intelligence (ICECAI)
Database:
IEEE Xplore Digital Library