Kerherve, G., Skinner, W., Hochhaus, J., Graf, A., Morgan, D., Isaacs, M., Reed, B., Nakajima, H. und Payne, D. (2026) „Kherve Fitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data.“, Surface & Interface Analysis: SIA, 58(1), S. 54-65. doi:10.1002/sia.70032.
Chicago Manual of Style 17th edition (full note)Kerherve, Gwilherm, William S. J. Skinner, Julian A. Hochhaus, Arthur Graf, David J. Morgan, Mark A. Isaacs, Benjamen P. Reed, Hideki Nakajima, und David J. Payne. „Kherve Fitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data.“. Surface & Interface Analysis: SIA 58, Nr. 1 (1. Januar 2026): 54-65. https://doi.org/10.1002/sia.70032.
American Psychological Association 7th editionKerherve, G., Skinner, W., Hochhaus, J., Graf, A., Morgan, D., Isaacs, M., Reed, B., Nakajima, H., & Payne, D. (2026). Kherve Fitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data. Surface & Interface Analysis: SIA, 58(1), 54-65. https://doi.org/10.1002/sia.70032
Modern Language Association 9th editionKerherve, G., W. Skinner, J. Hochhaus, A. Graf, D. Morgan, M. Isaacs, B. Reed, H. Nakajima, und D. Payne. „Kherve Fitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data.“. Surface & Interface Analysis: SIA, Bd. 58, Nr. 1, Januar 2026, S. 54-65, https://doi.org/10.1002/sia.70032.
ISO-690 (author-date, Deutsch)KERHERVE, Gwilherm, William S. J. SKINNER, Julian A. HOCHHAUS, Arthur GRAF, David J. MORGAN, Mark A. ISAACS, Benjamen P. REED, Hideki NAKAJIMA und David J. PAYNE, 2026. Kherve Fitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data. Surface & Interface Analysis: SIA. 1 Januar 2026. Bd. 58, Nr. 1, S. 54-65. DOI 10.1002/sia.70032