De Pauw, W. und Sevitsky, G. (2000) „Visualizing reference patterns for solving memory leaks in Java.“, Concurrency, Practice & Experience, 12(14), S. 1431-1454. doi:10.1002/1096-9128(20001210)12:143.0.CO;2-2.
Chicago Manual of Style 17th edition (full note)De Pauw, Wim, und Gary Sevitsky. „Visualizing Reference Patterns for Solving Memory Leaks in Java.“. Concurrency, Practice & Experience 12, Nr. 14 (1. November 2000): 1431-54. https://doi.org/10.1002/1096-9128(20001210)12:143.0.CO;2-2.
American Psychological Association 7th editionDe Pauw, W., & Sevitsky, G. (2000). Visualizing reference patterns for solving memory leaks in Java. Concurrency, Practice & Experience, 12(14), 1431-1454. https://doi.org/10.1002/1096-9128(20001210)12:143.0.CO;2-2
Modern Language Association 9th editionDe Pauw, W., und G. Sevitsky. „Visualizing Reference Patterns for Solving Memory Leaks in Java.“. Concurrency, Practice & Experience, Bd. 12, Nr. 14, November 2000, S. 1431-54, https://doi.org/10.1002/1096-9128(20001210)12:143.0.CO;2-2.
ISO-690 (author-date, Deutsch)DE PAUW, Wim und Gary SEVITSKY, 2000. Visualizing reference patterns for solving memory leaks in Java. Concurrency, Practice & Experience. 1 November 2000. Bd. 12, Nr. 14, S. 1431-1454. DOI 10.1002/1096-9128(20001210)12:143.0.CO;2-2